Design for Test(DFT)
We integrate comprehensive Design for Test (DFT) methodologies into your ASIC design flow to ensure high-quality manufacturing tests, improved yield, and reduced test costs.
TestableDesign Solutions
Our DFT services ensure your designs are testable and manufacturable, providing comprehensive test coverage while minimizing test costs and time.
Advanced scan chain and BIST implementation
Test compression and optimization techniques
JTAG and boundary scan implementation
300+
DFT Designs
99%
Test Coverage
60%
Test Time Reduction
40%
Cost Reduction
Our DFT Capabilities
From scan chain design to test compression, we deliver comprehensive DFT solutions that ensure your designs are testable and manufacturable.
Comprehensive scan chain implementation and optimization
- Scan insertion
- Scan compression
- Scan chain optimization
- Test coverage analysis
BIST implementation for memory and logic testing
- Memory BIST
- Logic BIST
- BIST controllers
- Test pattern generation
JTAG implementation for board-level testing
- JTAG controller
- Boundary scan cells
- TAP controller
- Test access port
Advanced test compression techniques for efficiency
- Compression algorithms
- Test data reduction
- Pattern compression
- Decompression logic
Why Choose OurDFT Services
Our proven track record and deep expertise in DFT implementation make us the preferred partner for semiconductor companies worldwide.
Test Coverage
Achieve high test coverage with minimal test time
Cost Reduction
Reduce test costs through efficient DFT implementation
Quality Assurance
Ensure device quality with comprehensive testing
Let's Make Your DesignTestable
Ready to optimize your design for testing? Our team of expert engineers is here to help you achieve your DFT goals.